Naeimi, Helia: search on Z-Library

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1

Analysis of Defects and Variations in Embedded Spin Transfer Torque (STT) MRAM Arrays

Chintaluri, Ashwin, Naeimi, Helia, Natarajan, Suriyaprakash, Raychowdhury, Arijit

Journal:

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Year:

2016

Language:

english

File:

PDF, 2.76 MB

english, 2016

2

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Design techniques for cross-layer resilience

Carter, Nicholas P, Naeimi, Helia, Gardner, Donald S

Year:

2010

Language:

english

File:

PDF, 1.51 MB

english, 2010

3

Relyzer

Hari, Siva Kumar Sastry, Adve, Sarita V., Naeimi, Helia, Ramachandran, Pradeep

Journal:

ACM SIGARCH Computer Architecture News

Year:

2012

Language:

english

File:

PDF, 863 KB

english, 2012

4

[IEEE 2014 ACM/IEEE 41st International Symposium on Computer Architecture (ISCA) - Minneapolis, MN, USA (2014.6.14-2014.6.18)] 2014 ACM/IEEE 41st International Symposium on Computer Architecture (ISCA) - GangES: Gang error simulation for hardware resiliency evaluation

Hari, Siva Kumar Sastry, Venkatagiri, Radha, Adve, Sarita V., Naeimi, Helia

Year:

2014

Language:

english

File:

PDF, 906 KB

english, 2014

5

[IEEE SC14: International Conference for High Performance Computing, Networking, Storage and Analysis - New Orleans, LA, USA (2014.11.16-2014.11.21)] SC14: International Conference for High Performance Computing, Networking, Storage and Analysis - Recycled Error Bits: Energy-Efficient Architectural Support for Floating Point Accuracy

Nathan, Ralph, Anthonio, Bryan, Lu, Shih-Lien, Naeimi, Helia, Sorin, Daniel J., Sun, Xiaobai

Year:

2014

Language:

english

File:

PDF, 536 KB

english, 2014

6

[IEEE 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Macao, Macao (2016.1.25-2016.1.28)] 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Data privacy in non-volatile cache: Challenges, attack models and solutions

Rathi, Nitin, Ghosh, Swaroop, Iyengar, Anirudh, Naeimi, Helia

Year:

2016

Language:

english

File:

PDF, 371 KB

english, 2016

7

[ACM Press the International Symposium - Alexandria, Virginia (2017.10.02-2017.10.05)] Proceedings of the International Symposium on Memory Systems - MEMSYS '17 - Probabilistic replacement strategies for improving the lifetimes of NVM-based caches

Reed, Elizabeth, Alameldeen, Alaa R., Naeimi, Helia, Stolt, Patrick

Year:

2017

Language:

english

File:

PDF, 770 KB

english, 2017

8

Relyzer: Application Resiliency Analyzer for Transient Faults

Sastry Hari, Siva Kumar, Adve, Sarita V., Naeimi, Helia, Ramachandran, Pradeep

Journal:

Year:

2013

Language:

english

File:

PDF, 870 KB

english, 2013

9

[IEEE 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Boston, MA, USA (2012.06.25-2012.06.28)] IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) - Low-cost program-level detectors for reducing silent data corruptions

Hari, Siva Kumar Sastry, Adve, Sarita V., Naeimi, Helia

Year:

2012

Language:

english

File:

PDF, 287 KB

english, 2012

10

GangES

Sastry Hari, Siva Kumar, Venkatagiri, Radha, Adve, Sarita V., Naeimi, Helia

Journal:

ACM SIGARCH Computer Architecture News

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

11

Fault-tolerant sub-lithographic design with rollback recovery

Naeimi, Helia, DeHon, André

Journal:

Year:

2008

Language:

english

File:

PDF, 659 KB

english, 2008

12

[ACM Press the seventeenth international conference - London, England, UK (2012.03.03-2012.03.07)] Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS '12 - Relyzer

Hari, Siva Kumar Sastry, Adve, Sarita V., Naeimi, Helia, Ramachandran, Pradeep

Year:

2012

Language:

english

File:

PDF, 863 KB

english, 2012

13

[IEEE 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Storrs, CT, USA (2016.9.19-2016.9.20)] 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Side channel attacks on STTRAM and low-overhead countermeasures

Iyengar, Anirudh, Ghosh, Swaroop, Rathi, Nitin, Naeimi, Helia

Year:

2016

Language:

english

File:

PDF, 1.72 MB

english, 2016

14

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Fault Secure Encoder and Decoder for Memory Applications

Naeimi, Helia, DeHon, Andre

Year:

2007

Language:

english

File:

PDF, 445 KB

english, 2007

15

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - QED: Quick Error Detection tests for effective post-silicon validation

Hong, Ted, Li, Yanjing, Park, Sung-Boem, Mui, Diana, Lin, David, Kaleq, Ziyad Abdel, Hakim, Nagib, Naeimi, Helia, Gardner, Donald S., Mitra, Subhasish

Year:

2010

Language:

english

File:

PDF, 1.90 MB

english, 2010

16

[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Innovative practices session 5C: Cloud atlas — Unreliability through massive connectivity

Naeimi, Helia, Natarajan, Suriya, Vaid, Kushagra, Kudva, Prabhakar, Natu, Mahesh

Year:

2013

Language:

english

File:

PDF, 54 KB

english, 2013

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